- Measuring Accuracy: +/- 1%
- Detection Rate: ≤1s for every point
- Impedance Measurment Range: 20 ~ 150Ω
- Measuring Range: 0.05 ~ 2m
- Wave Bandwidth: 3 GHz
- Power Supply: AC220V/50Hz, 200W
- Power Consumption: ≤200 W
- Grounding Voltage: ≤ 0.3 V
- Overall Size: 490(L) mm×355(W) mm×170(H) mm
- Weight: 15kg
- Customized

1) X-ray tube :  Mo/Rh/W/Ag Target(Option), 50kVp, 1mA
2) Detection System Si-Pin Diode(SDD)
3) Energy Resolution Si-Pin Diode : 149eV FWHM at Mn Kα 
4) Collimator : 0.3 Collimator , Capillary Optics 50um, Manual / Auto Changing Stage
5) Detection Element : Ti(22)~U(92)
6) Sample Type Solid / Liquid / Powder, Multi-Layer
7) Size of the sample chamber 660mmX450mmX150mm / 500mmX450mmX150mm
8) Sample stage moving possible distance : 300mmX200mmX150mm / 220mmX200mmX150mm
9) Size of the sample table 310mm X 260mm
10) Key Features : 
- Auto / Manual Stage Mode, 
- Plating thickness measurement : General, Rh, Pd, Au, Ag, Sn, Ni
- Film thickness measurement of multilayer thin films (up to 5 Layer)
11) Camera Magnification : 40~80 x
12) Safety : 3 point interlock
13) Type of Report : Excel, PDF / output, Custom form
14) Key Benefits:  
- Film thickness measurement of multilayer thin films (up to 5 Layer)
- Convenient stage control
- Multi-point measurement possible
- RoHS Screening 
15) Customized(Including Standard Specimen : Au 1EA, Ni 3EA)